Characterization of Zinc Oxide (ZnO) Thin Films Prepared by RF-Sputtering, Sol-Gel, and Evaporation Methods for Optoelectronic Applications. International Journal of Scientific Research in Science and Technology, [S. l.], v. 13, n. 2, p. 913–921, 2026. DOI: 10.32628/IJSRST2613373. Disponível em: https://mail.ijsrst.com/index.php/home/article/view/IJSRST2613373. Acesso em: 29 apr. 2026.